Dldss-110 Page

| Year | Planned Feature | Expected Impact | |------|----------------|-----------------| | | Dual‑wavelength module (532 nm + 635 nm) | Enables material‑specific reflectivity contrast. | | 2026 Q2 | Integrated AI‑based defect classification (edge‑device inference) | Real‑time pass/fail decision without external PC. | | 2026 Q4 | Miniaturized version DLDSS‑110‑Mini (70 mm × 50 mm) | Portable field inspections (e.g., on‑site aircraft panels). | | 2027 | Full 3‑D volumetric scanning (adding a second linear detector) | Direct voxel data acquisition for complex geometries. |